You are hereHomeResources
Faster, more accurate defect detection requires more than superior equipment. Sonix provides the expertise needed to solve customer challenges. This is your source for technical papers, product literature and other information to help you optimize defect detection and productivity.
Here you’ll find in-depth discussion of wafer and packaged semiconductor applications, acoustic scanning and analysis techniques, best practices and other technical topics.
Learn more about Sonix scanning acoustic microscopes, Sonix transducers, hardware and software options. Sonix systems can be configured to provide the best possible results in a wide variety of applications.
Request a sample analysis