Resources

Faster, more accurate defect detection requires more than superior equipment. Sonix provides the expertise needed to solve customer challenges. This is your source for non-destructive testing pdf resources, including technical papers, product literature and other information to help you optimize defect detection and productivity.

FAQS

This is the place to begin for answers to the most frequently asked questions.

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PRODUCT LITERATURE

Watch, read and learn more about Sonix scanning acoustic microscopes, transducers, and options for achieving the best application results.

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TECHNICAL PAPERS

Here you’ll find technical discussions of wafer and packaged semiconductor applications, acoustic scanning and analysis best practices, and more.

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